Software for Semiconductor Test - Instrument Control, Data Acquisition and Numerical Analysis
Metrics Technology's software products provide easy setup of supported semiconductor test systems through a point and click Windows user interface
Device Characterization
Metrics provides instrument control, data acquisition and numerical analysis for performing device charaterization and parameter extraction
Wafer Level Reliability
Based on industry standard JEDEC test methods our Metrics WLR fast wafer-level algorithms will get your reliability program up and running quickly
Failure Analysis
Analytical labs worldwide use Metrics products to perform root cause analysis of failures in semiconductor components and microelectronics